Thickness-Dependent Polar Domain Evolution in Strained, Ultrathin PbTiO3Films
Gong, Feng-Hui1,2; Chen, Yu-Ting1,2; Zhu, Yin-Lian1,3; Tang, Yun-Long1; Zhang, Heng1,2; Wang, Yu-Jia1; Wu, Bo3; Liu, Jia-Qi1,2; Shi, Tong-Tong1,2; Yang, Li-Xin1
2022-02-23
发表期刊ACS Applied Materials and Interfaces
ISSN1944-8244
卷号14期号:7页码:9724-9733
摘要Ferroelectric ultrathin films have great potential in electronic devices and device miniaturization with the innovation of technology. In the process of product commercialization, understanding the domain evolution and topological properties of ferroelectrics is a prerequisite for high-density storage devices. In this work, a series of ultrathin PbTiO3(PTO) films with varying thicknesses were deposited on cubic KTaO3substrates by pulsed laser deposition and were researched by Cs-corrected scanning transmission electron microscopy (STEM), reciprocal space mapping (RSM), and piezoresponse force microscopy (PFM). RSM experiments indicate the existence of a/c domains and show that the lattice constant varies continuously, which is further confirmed by atomic-scale STEM imaging. Diffraction contrast analysis clarifies that with the decrease in PTO film thickness, the critical thickness for the formation of a/c domains could be missing. When the thickness of PTO films is less than 6 nm, the domain configurations in the ultrathin PTO films are the coexistence of a/c domains and bowl-like topological structures, where the latter ones were identified as convergent and divergent types of meron. In addition, abundant 90° charged domain walls in these ultrathin PTO films were identified. PFM studies reveal clear ferroelectric properties for these ultrathin PTO films. These results may shed light on further understanding the domain evolution and topological properties in ultrathin ferroelectric PTO films. © 2022 American Chemical Society. All rights reserved.
关键词Domain walls Ferroelectric films Ferroelectricity High resolution transmission electron microscopy Lead titanate Pulsed laser deposition Scanning probe microscopy Strontium titanates Titanium compounds Topology Ultrathin films Virtual storage A/ c domain C-domain Critical thickness Domain evolution Meron Reciprocal space mapping Scanning transmission electron microscopy Topological properties Ultra-thin Ultrathin PbTiO3film
DOI10.1021/acsami.1c20797
收录类别EI
语种英语
出版者American Chemical Society
EI入藏号20220811700652
EI主题词Scanning electron microscopy
EI分类号701.1 Electricity: Basic Concepts and Phenomena ; 708.1 Dielectric Materials ; 722.1 Data Storage, Equipment and Techniques ; 741.3 Optical Devices and Systems ; 744.9 Laser Applications ; 801 Chemistry ; 804 Chemical Products Generally ; 804.2 Inorganic Compounds ; 921.4 Combinatorial Mathematics, Includes Graph Theory, Set Theory
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被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符https://ir.lut.edu.cn/handle/2XXMBERH/157856
专题材料科学与工程学院_特聘教授组
作者单位1.Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, Shenyang; 110016, China;
2.School of Materials Science and Engineering, University of Science and Technology of China, Wenhua Road 72, Shenyang; 110016, China;
3.Bay Area Center for Electron Microscopy, Songshan Lake Materials Laboratory, Guangdong, Dongguan; 523808, China;
4.State Key Lab of Advanced Processing and Recycling on Non-ferrous Metals, Lanzhou University of Technology, Langongping Road 287, Lanzhou; 730050, China
第一作者单位材料科学与工程学院
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GB/T 7714
Gong, Feng-Hui,Chen, Yu-Ting,Zhu, Yin-Lian,et al. Thickness-Dependent Polar Domain Evolution in Strained, Ultrathin PbTiO3Films[J]. ACS Applied Materials and Interfaces,2022,14(7):9724-9733.
APA Gong, Feng-Hui.,Chen, Yu-Ting.,Zhu, Yin-Lian.,Tang, Yun-Long.,Zhang, Heng.,...&Ma, Xiu-Liang.(2022).Thickness-Dependent Polar Domain Evolution in Strained, Ultrathin PbTiO3Films.ACS Applied Materials and Interfaces,14(7),9724-9733.
MLA Gong, Feng-Hui,et al."Thickness-Dependent Polar Domain Evolution in Strained, Ultrathin PbTiO3Films".ACS Applied Materials and Interfaces 14.7(2022):9724-9733.
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