Thickness-dependent evolution of piezoresponses and a / c domains in [101]-oriented PbTiO3ferroelectric films

doi:10.1063/5.0028929

	Thickness-dependent evolution of piezoresponses and a / c domains in [101]-oriented PbTiO3ferroelectric films
	Feng, Y. P.1,2; Tang, Y. L.3; Zhu, Y. L.3; Zou, M. J.1,2; Wang, Y. J.3; Ma, X. L.3,4
	2020-12-14
发表期刊	Journal of Applied Physics
ISSN	00218979
卷号	128 期号:22
摘要	It is known that high-index perovskite ferroelectric thin films exhibit giant permittivity, piezoelectric response, and a particular switching behavior. However, the fine domain configuration in high-index ferroelectric films is not yet clarified, which triggers difficulties to further modulate their electric properties. In this work, we focus on the tetragonal PbTiO3 thin films with thicknesses of 20, 40, 55, and 70 nm deposited on a [101]-oriented KTaO3 substrate. By using piezoresponse force microscopy and state-of-the-art scanning transmission electron microscopy, the stripe a/c domains with alternately wide c and narrow a domains are observed in all these PbTiO3 films. The periodic stripe a/c domains with {101} domain walls extend along the in-plane [11 1 ¯] or [1 1 ¯ 1 ¯] direction, which almost completely relaxes the misfit strain between the PbTiO3 films and the KTaO3 substrate. The domain width decreases as the film thickness is reduced following the square root dependence. This results in an increase of ferroelastic a/c domain walls and promotes the enhancement of the piezoresponse amplitude for the thinner PbTiO3 films. In addition, the piezoresponse amplitude of a 20 nm PbTiO3 film is comparable to that of a 40 nm PbTiO3 film, which indicates that the piezoelectric response of ferroelectric films may saturate at a certain film thickness and scarcely increase even after the film thickness reduces further. These results clarify the domain configurations of [101]-oriented PbTiO3 thin films and provide useful information for understanding the relationship between microstructures and piezoelectric properties in ferroelectric films. © 2020 Author(s).
关键词	Domain walls Ferroelectric films Ferroelectric thin films Ferroelectricity Film thickness High resolution transmission electron microscopy Lead titanate Perovskite Piezoelectricity Scanning electron microscopy Scanning probe microscopy Tantalum compounds Domain configurations Giant permittivity Piezoelectric property Piezoelectric response Piezoresponse force microscopy Scanning transmission electron microscopy Square-root dependence Switching behaviors
DOI	10.1063/5.0028929
收录类别	EI ; SCIE
语种	英语
WOS研究方向	Physics
WOS类目	Physics, Applied
WOS记录号	WOS:000598499100002
出版者	American Institute of Physics Inc.
EI入藏号	20205109636304
EI主题词	Thin films
EI分类号	482.2 Minerals ; 701.1 Electricity: Basic Concepts and Phenomena ; 708.1 Dielectric Materials ; 741.3 Optical Devices and Systems ; 801 Chemistry
来源库	WOS
引用统计	被引频次：9[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	https://ir.lut.edu.cn/handle/2XXMBERH/151092
专题	兰州理工大学
通讯作者	Ma, X. L.
作者单位	1.Songshan Lake Mat Lab, Dongguan 523808, Guangdong, Peoples R China; 2.Chinese Acad Sci, Inst Phys, Beijing 100190, Peoples R China; 3.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Wenhua Rd 72, Shenyang 110016, Peoples R China; 4.Lanzhou Univ Technol, State Key Lab Adv Proc & Recycling Nonferrous Met, Langongping Rd 287, Lanzhou 730050, Peoples R China
通讯作者单位	省部共建有色金属先进加工与再利用国家重点实验室
推荐引用方式 GB/T 7714	Feng, Y. P.,Tang, Y. L.,Zhu, Y. L.,et al. Thickness-dependent evolution of piezoresponses and a / c domains in [101]-oriented PbTiO3ferroelectric films[J]. Journal of Applied Physics,2020,128(22).
APA	Feng, Y. P.,Tang, Y. L.,Zhu, Y. L.,Zou, M. J.,Wang, Y. J.,&Ma, X. L..(2020).Thickness-dependent evolution of piezoresponses and a / c domains in [101]-oriented PbTiO3ferroelectric films.Journal of Applied Physics,128(22).
MLA	Feng, Y. P.,et al."Thickness-dependent evolution of piezoresponses and a / c domains in [101]-oriented PbTiO3ferroelectric films".Journal of Applied Physics 128.22(2020).