Double synchronous-step-down-stress accelerated life testing method | |
Kou, Hai-Xia; An, Zong-Wen![]() | |
2016-03-30 | |
发表期刊 | Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China
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ISSN | 10010548 |
卷号 | 45期号:2页码:316-320 |
摘要 | Reliability evaluation for products of high-reliability and long-lifetime is one of the challenges in reliability engineering. A method of double synchronous-step-down-stress accelerated life testing (DSSDS-ALT) is proposed by considering the long testing time and low efficiency of the double cross-step-down-stress accelerated life testing (DCSDS-ALT). The method uses the drop way of synchronous-step-down for two accelerated stress to form a sloping down trajectory, so it can improve the test efficiency and the whole test state. Numerical simulation was made for the DSSDS-ALT with Monte Carlo method for products whose lifetime follows Weibull distribution. The results indicate that DSSDS-ALT can save testing time and improve efficiency of the test. © 2016, Editorial Board of Journal of the University of Electronic Science and Technology of China. All right reserved. |
关键词 | Efficiency Electron emission Numerical methods Reliability Testing Weibull distribution Accelerated life testing Accelerated life tests Accelerated stress High reliability Reliability engineering Reliability Evaluation Step down Test efficiency |
DOI | 10.3969/j.issn.1001-0548.2016.03.027 |
收录类别 | EI |
语种 | 中文 |
出版者 | Univ. of Electronic Science and Technology of China |
EI入藏号 | 20161602269704 |
EI主题词 | Monte Carlo methods |
EI分类号 | 913.1 Production Engineering - 921.6 Numerical Methods - 922.2 Mathematical Statistics |
来源库 | Compendex |
分类代码 | 913.1 Production Engineering - 921.6 Numerical Methods - 922.2 Mathematical Statistics |
引用统计 | 无
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文献类型 | 期刊论文 |
条目标识符 | https://ir.lut.edu.cn/handle/2XXMBERH/112539 |
专题 | 机电工程学院 |
作者单位 | School of Mechatronics Engineering, Lanzhou University of Technology, Lanzhou; 730050, China |
第一作者单位 | 兰州理工大学 |
第一作者的第一单位 | 兰州理工大学 |
推荐引用方式 GB/T 7714 | Kou, Hai-Xia,An, Zong-Wen,Liu, Bo. Double synchronous-step-down-stress accelerated life testing method[J]. Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China,2016,45(2):316-320. |
APA | Kou, Hai-Xia,An, Zong-Wen,&Liu, Bo.(2016).Double synchronous-step-down-stress accelerated life testing method.Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China,45(2),316-320. |
MLA | Kou, Hai-Xia,et al."Double synchronous-step-down-stress accelerated life testing method".Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China 45.2(2016):316-320. |
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