Double synchronous-step-down-stress accelerated life testing method

doi:10.3969/j.issn.1001-0548.2016.03.027

IR > 机电工程学院

	Double synchronous-step-down-stress accelerated life testing method
	Kou, Hai-Xia; An, Zong-Wen; Liu, Bo
	2016-03-30
发表期刊	Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China
ISSN	10010548
卷号	45 期号:2 页码:316-320
摘要	Reliability evaluation for products of high-reliability and long-lifetime is one of the challenges in reliability engineering. A method of double synchronous-step-down-stress accelerated life testing (DSSDS-ALT) is proposed by considering the long testing time and low efficiency of the double cross-step-down-stress accelerated life testing (DCSDS-ALT). The method uses the drop way of synchronous-step-down for two accelerated stress to form a sloping down trajectory, so it can improve the test efficiency and the whole test state. Numerical simulation was made for the DSSDS-ALT with Monte Carlo method for products whose lifetime follows Weibull distribution. The results indicate that DSSDS-ALT can save testing time and improve efficiency of the test. © 2016, Editorial Board of Journal of the University of Electronic Science and Technology of China. All right reserved.
关键词	Efficiency Electron emission Numerical methods Reliability Testing Weibull distribution Accelerated life testing Accelerated life tests Accelerated stress High reliability Reliability engineering Reliability Evaluation Step down Test efficiency
DOI	10.3969/j.issn.1001-0548.2016.03.027
收录类别	EI
语种	中文
出版者	Univ. of Electronic Science and Technology of China
EI入藏号	20161602269704
EI主题词	Monte Carlo methods
EI分类号	913.1 Production Engineering - 921.6 Numerical Methods - 922.2 Mathematical Statistics
来源库	Compendex
分类代码	913.1 Production Engineering - 921.6 Numerical Methods - 922.2 Mathematical Statistics
引用统计	无
文献类型	期刊论文
条目标识符	https://ir.lut.edu.cn/handle/2XXMBERH/112539
专题	机电工程学院
作者单位	School of Mechatronics Engineering, Lanzhou University of Technology, Lanzhou; 730050, China
第一作者单位	兰州理工大学
第一作者的第一单位	兰州理工大学
推荐引用方式 GB/T 7714	Kou, Hai-Xia,An, Zong-Wen,Liu, Bo. Double synchronous-step-down-stress accelerated life testing method[J]. Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China,2016,45(2):316-320.
APA	Kou, Hai-Xia,An, Zong-Wen,&Liu, Bo.(2016).Double synchronous-step-down-stress accelerated life testing method.Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China,45(2),316-320.
MLA	Kou, Hai-Xia,et al."Double synchronous-step-down-stress accelerated life testing method".Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China 45.2(2016):316-320.