Thickness-Dependent Polar Domain Evolution in Strained, Ultrathin PbTiO3 Films

doi:10.1021/acsami.1c20797

	Thickness-Dependent Polar Domain Evolution in Strained, Ultrathin PbTiO3 Films
	Gong, Feng-Hui 1,3; Chen, Yu-Ting 1,3; Zhu, Yin-Lian 1,2; Tang, Yun-Long 1; Zhang, Heng 1,3; Wang, Yu-Jia 1; Wu, Bo 2; Liu, Jia-Qi 1,3; Shi, Tong-Tong 1,3; Yang, Li-Xin 1
	2022-02-23
发表期刊	ACS APPLIED MATERIALS & INTERFACES
ISSN	1944-8244
卷号	14 期号:7 页码:9724-9733
摘要	Ferroelectric ultrathin films have great potential in electronic devices and device miniaturization with the innovation of technology. In the process of product commercialization, understanding the domain evolution and topological properties of ferroelectrics is a prerequisite for high-density storage devices. In this work, a series of ultrathin PbTiO3 (PTO) films with varying thicknesses were deposited on cubic KTaO3 substrates by pulsed laser deposition and were researched by Cs-corrected scanning transmission electron microscopy (STEM), reciprocal space mapping (RSM), and piezoresponse force microscopy (PFM). RSM experiments indicate the existence of a/c domains and show that the lattice constant varies continuously, which is further confirmed by atomic-scale STEM imaging. Diffraction contrast analysis clarifies that with the decrease in PTO film thickness, the critical thickness for the formation of a/c domains could be missing. When the thickness of PTO films is less than 6 nm, the domain configurations in the ultrathin PTO films are the coexistence of a/c domains and bowl-like topological structures, where the latter ones were identified as convergent and divergent types of meron. In addition, abundant 90 degrees charged domain walls in these ultrathin PTO films were identified. PFM studies reveal clear ferroelectric properties for these ultrathin PTO films. These results may shed light on further understanding the domain evolution and topological properties in ultrathin ferroelectric PTO films.
关键词	scanning transmission electron microscopy critical thickness a/c domain meron ultrathin PbTiO3 films
DOI	10.1021/acsami.1c20797
收录类别	SCIE
语种	英语
WOS研究方向	Science & Technology - Other Topics ; Materials Science
WOS类目	Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary
WOS记录号	WOS:000758076000001
出版者	AMER CHEMICAL SOC
来源库	WOS
引用统计	被引频次：1[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	https://ir.lut.edu.cn/handle/2XXMBERH/162447
专题	材料科学与工程学院_特聘教授组
通讯作者	Zhu, Yin-Lian; Tang, Yun-Long
作者单位	1.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China; 2.Bay Area Ctr Electron Microscopy, Songshan Lake Mat Lab, Dongguan 523808, Guangdong, Peoples R China; 3.Univ Sci & Technol China, Sch Mat Sci & Engn, Shenyang 110016, Peoples R China; 4.Lanzhou Univ Technol, State Key Lab Adv Proc & Recycling Nonferrous Met, Lanzhou 730050, Peoples R China
推荐引用方式 GB/T 7714	Gong, Feng-Hui,Chen, Yu-Ting,Zhu, Yin-Lian,et al. Thickness-Dependent Polar Domain Evolution in Strained, Ultrathin PbTiO3 Films[J]. ACS APPLIED MATERIALS & INTERFACES,2022,14(7):9724-9733.
APA	Gong, Feng-Hui.,Chen, Yu-Ting.,Zhu, Yin-Lian.,Tang, Yun-Long.,Zhang, Heng.,...&Ma, Xiu-Liang.(2022).Thickness-Dependent Polar Domain Evolution in Strained, Ultrathin PbTiO3 Films.ACS APPLIED MATERIALS & INTERFACES,14(7),9724-9733.
MLA	Gong, Feng-Hui,et al."Thickness-Dependent Polar Domain Evolution in Strained, Ultrathin PbTiO3 Films".ACS APPLIED MATERIALS & INTERFACES 14.7(2022):9724-9733.