HBase fault recovery technology based on two-phase commit protocol

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	HBase fault recovery technology based on two-phase commit protocol
	Bao, Guang-Bin1,2 ; Luan, Yang-Yang 1; Zhao, Hong1,3
	2012-12-01
发表期刊	Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology
ISSN	10010645
卷号	32 期号:SUPPL.1 页码:205-208
摘要	It will cause the loss of date if an anomaly occurs during HBase splitting progress. The failure recovery method is put forward in this paper, which takes HBase distributed database as a research platform. The method is based on two-phase commit protocol and referenced to the relational distributed database failure recovery method. The experiment shows that it can effectively improve the high availability of HBase.
关键词	Computer science Engineering Distributed database Failure recovery Fault recovery HBase High availability Research platforms Two phase commit protocols
收录类别	EI
语种	中文
出版者	Beijing Institute of Technology
EI入藏号	20130515972918
EI主题词	Distributed database systems
EI分类号	723.3 Database Systems
来源库	Compendex
分类代码	723.3 Database Systems
文献类型	期刊论文
条目标识符	https://ir.lut.edu.cn/handle/2XXMBERH/111526
专题	计算机与通信学院网络与信息中心
作者单位	1.School of Computer and Communication, Lanzhou University of Technology, Lanzhou, Gansu 730050, China; 2.Digital City Construction Office of Lanzhou, Lanzhou, Gansu 730050, China; 3.National Linux Technology Training and the Promotion Center, Lanzhou, Gansu 730050, China
第一作者单位	兰州理工大学
第一作者的第一单位	兰州理工大学
推荐引用方式 GB/T 7714	Bao, Guang-Bin,Luan, Yang-Yang,Zhao, Hong. HBase fault recovery technology based on two-phase commit protocol[J]. Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology,2012,32(SUPPL.1):205-208.
APA	Bao, Guang-Bin,Luan, Yang-Yang,&Zhao, Hong.(2012).HBase fault recovery technology based on two-phase commit protocol.Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology,32(SUPPL.1),205-208.
MLA	Bao, Guang-Bin,et al."HBase fault recovery technology based on two-phase commit protocol".Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology 32.SUPPL.1(2012):205-208.